Geant4-11
G4MicroElecMaterialStructure.hh
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25//
26//
27// G4MicroElecMaterialStructure.hh, 2011/08/29 A.Valentin, M. Raine are with CEA [a]
28// 2020/05/20 P. Caron, C. Inguimbert are with ONERA [b]
29// Q. Gibaru is with CEA [a], ONERA [b] and CNES [c]
30// M. Raine and D. Lambert are with CEA [a]
31//
32// A part of this work has been funded by the French space agency(CNES[c])
33// [a] CEA, DAM, DIF - 91297 ARPAJON, France
34// [b] ONERA - DPHY, 2 avenue E.Belin, 31055 Toulouse, France
35// [c] CNES, 18 av.E.Belin, 31401 Toulouse CEDEX, France
36//
37// Based on the following publications
38// - A.Valentin, M. Raine,
39// Inelastic cross-sections of low energy electrons in silicon
40// for the simulation of heavy ion tracks with the Geant4-DNA toolkit,
41// NSS Conf. Record 2010, pp. 80-85
42// https://doi.org/10.1109/NSSMIC.2010.5873720
43//
44// - A.Valentin, M. Raine, M.Gaillardin, P.Paillet
45// Geant4 physics processes for microdosimetry simulation:
46// very low energy electromagnetic models for electrons in Silicon,
47// https://doi.org/10.1016/j.nimb.2012.06.007
48// NIM B, vol. 288, pp. 66-73, 2012, part A
49// heavy ions in Si, NIM B, vol. 287, pp. 124-129, 2012, part B
50// https://doi.org/10.1016/j.nimb.2012.07.028
51//
52// - M. Raine, M. Gaillardin, P. Paillet
53// Geant4 physics processes for silicon microdosimetry simulation:
54// Improvements and extension of the energy-range validity up to 10 GeV/nucleon
55// NIM B, vol. 325, pp. 97-100, 2014
56// https://doi.org/10.1016/j.nimb.2014.01.014
57//
58// - J. Pierron, C. Inguimbert, M. Belhaj, T. Gineste, J. Puech, M. Raine
59// Electron emission yield for low energy electrons:
60// Monte Carlo simulation and experimental comparison for Al, Ag, and Si
61// Journal of Applied Physics 121 (2017) 215107.
62// https://doi.org/10.1063/1.4984761
63//
64// - P. Caron,
65// Study of Electron-Induced Single-Event Upset in Integrated Memory Devices
66// PHD, 16th October 2019
67//
68// - Q.Gibaru, C.Inguimbert, P.Caron, M.Raine, D.Lambert, J.Puech,
69// Geant4 physics processes for microdosimetry and secondary electron emission simulation :
70// Extension of MicroElec to very low energies and new materials
71// NIM B, 2020, in review.
72//
73//
74//....oooOO0OOooo........oooOO0OOooo........oooOO0OOooo........oooOO0OOooo......
75
76#ifndef G4MICROELECMATERIALSTRUCTURE_HH
77#define G4MICROELECMATERIALSTRUCTURE_HH 1
78
79#include "globals.hh"
80#include "G4Material.hh"
81#include <vector>
82
84{
85public:
86 G4MicroElecMaterialStructure(const G4String& matName = "");
88
89 void ReadMaterialFile();
90 G4double Energy(G4int level);
92 G4double GetZ(G4int Shell);
93 G4double ConvertUnit(const G4String& unitName);
96 G4int GetEADL_Enumerator(G4int shell) { return EADL_Enumerator[shell]; };
105
106private:
107 // private elements
108 G4int nLevels = 3; // Number of levels of material
111 std::vector<G4bool> isShellWeaklyBoundVector;
112 std::vector<G4double> energyConstant;
113 std::vector<G4double> LimitEnergy;
114 std::vector<G4int> EADL_Enumerator;
117 std::vector<G4double> compoundShellZ;
118 G4double Z = 0.0;
120 G4double limitElastic[2] = { 0,0 };
121 G4double limitInelastic[4] = { 0,0,0,0 };
122};
123
124#endif
double G4double
Definition: G4Types.hh:83
bool G4bool
Definition: G4Types.hh:86
int G4int
Definition: G4Types.hh:85
G4double ConvertUnit(const G4String &unitName)
G4MicroElecMaterialStructure(const G4String &matName="")